| Manufacturer | Part # | Datasheet | Description |
 TDK Electronics |
AEC-Q200
|
1Mb/12P
|
CGJ series l High Reliability Series
|
 TT Electronics. |
AEC-Q200
|
623Kb/9P
|
Thick Film Chip Arrays
|
 TDK Electronics |
AEC-Q200
|
177Kb/4P
|
Inductors for decoupling circuits Multilayer ferrite MLJ-G series (for automotive PoC)
20220601
|
 Cornell Dubilier Electr... |
AEC-Q200
|
692Kb/9P
|
85 °C / 85% RH , 1500h @ Vr, AEC-Q200 Qualified
|
 TDK Electronics |
AEC-Q200
|
223Kb/5P
|
CLF10060NI-D type
2020
|
|
AEC-Q200
|
443Kb/14P
|
Chip varistors Voltage Protection Devices
20231012
|
| Search Partnumber :
Start with "AEC-Q200" -
Total : 119 ( 1/6 Page) |
 TDK Electronics |
AEC-Q200
|
223Kb/5P |
CLF10060NI-D type
2020 |
|
AEC-Q200
|
443Kb/14P |
Chip varistors Voltage Protection Devices
20231012 |
 List of Unclassifed Man... |
AEC-Q100-001
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
|
AEC-Q100-002
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
|
AEC-Q100-003
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
|
AEC-Q100-004
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
|
AEC-Q100-005
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
|
AEC-Q100-006
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
|
AEC-Q100-007
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
|
AEC-Q100-008
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
|
AEC-Q100-009
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
|
AEC-Q100-009B
|
49Kb/10P |
ELECTRICAL DISTRIBUTIONS ASSESSMENT
|
|
AEC-Q100-010
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
|
AEC-Q100-011
|
814Kb/48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |