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LMK04828SNKDREP Datasheet (PDF) - Texas Instruments

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LMK04828SNKDREP Datasheet PDF - Texas Instruments
Part # LMK04828SNKDREP
Download  LMK04828SNKDREP Download
File Size   1768.75 Kbytes
Page   102 Pages
Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments
Description LMK04828-EP Ultra-Low-Noise, JESD204B-Compliant Clock Jitter Cleaner

LMK04828SNKDREP Datasheet (PDF)

Go To PDF Page Download Datasheet
LMK04828SNKDREP Datasheet PDF - Texas Instruments

Part # LMK04828SNKDREP
Download  LMK04828SNKDREP Click to download

File Size   1768.75 Kbytes
Page   102 Pages
Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments
Description LMK04828-EP Ultra-Low-Noise, JESD204B-Compliant Clock Jitter Cleaner

LMK04828SNKDREP Datasheet (HTML) - Texas Instruments


LMK04828SNKDREP Product details

1 Features
1• EP Features
– Gold Bondwires
– Temperature Range: –55 to +105 °C
– Lead Finish SnPb
• Maximum Distribution Frequency: 3.2 GHz
• JESD204B Support
• Ultra-Low RMS Jitter
– 88-fs RMS Jitter (12 kHz to 20 MHz)
– 91-fs RMS Jitter (100 Hz to 20 MHz)
– –162.5 dBc/Hz Noise Floor at 245.76 MHz
• Up to 14 Differential Device Clocks From PLL2
– Up to 7 SYSREF Clocks
– Maximum Clock Output Frequency 3.2 GHz
– LVPECL, LVDS, HSDS, LCPECL
Programmable Outputs From PLL2
• Up to 1 Buffered VCXO/Crystal Output From PLL1
– LVPECL, LVDS, 2xLVCMOS Programmable
• Multi-Mode: Dual PLL, Single PLL, and Clock
Distribution
• Dual Loop PLLatinum™ PLL Architecture
• PLL1
– Up to 3 Redundant Input Clocks
– Automatic and Manual Switchover Modes
– Hitless Switching and LOS
– Integrated Low-Noise Crystal Oscillator Circuit
– Holdover Mode When Input Clocks are Lost
• PLL2
– Normalized [1 Hz] PLL Noise Floor of
–227 dBc/Hz
– Phase Detector Rate up to 155 MHz
– OSCin Frequency-Doubler
– Two Integrated Low-Noise VCOs
• 50% Duty Cycle Output Divides, 1 to 32
(Even and Odd)
• Precision Digital Delay, Dynamically Adjustable
• 25-ps Step Analog Delay
• 3.15-V to 3.45-V Operation
• Package: 64-Pin WQFN (9.0 mm × 9.0 mm × 0.8
mm)

2 Applications
• Wireless Infrastructure
• Data Converter Clocking
• Networking, SONET/SDH, DSLAM
• Medical / Video / Military / Aerospace
• Test and Measurement

3 Description
The LMK04828-EP device is the industry's highest
performance clock conditioner with JESD204B
support.
The 14 clock outputs from PLL2 can be configured to
drive seven JESD204B converters or other logic
devices using device and SYSREF clocks. SYSREF
can be provided using both DC and AC coupling. Not
limited to JESD204B applications, each of the 14
outputs can be individually configured as highperformance
outputs for traditional clocking systems.
The high performance combined with features like the
ability to trade off between power or performance,
dual VCOs, dynamic digital delay, holdover, and
glitchless analog delay make the LMK04828-EP ideal
for providing flexible high-performance clocking trees.




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About Texas Instruments


Texas Instruments (TI) is a publicly traded company that designs and manufactures semiconductor and computer technology products.

It was founded in 1930 and is headquartered in Dallas, Texas.

TI is a global leader in the production of analog and digital signal processing (DSP) integrated circuits, as well as embedded processors and other microcontroller products.

The company serves customers in a variety of industries, including automotive, communications, computing, industrial, and consumer electronics.

TI's product portfolio includes data converters, amplifiers and comparators, power management ICs, microcontrollers, sensors, and wireless connectivity solutions, among others.

TI is committed to innovation and customer satisfaction, and has a long history of delivering high-quality, reliable products to its customers.

With a focus on sustainability and energy efficiency, TI is dedicated to making a positive impact on the world through its technology and products.

*This information is for general informational purposes only, we will not be liable for any loss or damage caused by the above information.




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